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Photoelectron spectra (XPS) of sulfur in metal di- and perthiocarboxylates 1-gen-1978 CAPECE M., F; Furlani, C; Mattogno, G; Paparazzo, E; Polzonetti, Giovanni
XPS photoelectron study (ESCA) of some nickel (II) phosphine complexes with catalytic activity in cyclotrimerization reaction of acetylenes 1-gen-1978 Furlani, A; Polzonetti, Giovanni; RURRO M., V; Mattogno, G.
Characterization of palladium-on-alumina catalysts by X-ray photoelectron spectroscopy 1-gen-1978 Mattogno, G; Polzonetti, Giovanni; Tauszik, G. R.
Relationship between XPS core binding energies and atomic charge in adducts of Sn (IV) derivatives with pyrazine and comparison with Mossbauer isomer shift 1-gen-1981 Furlani, C; Mattogno, G; Polzonetti, Giovanni; Barbieri, R; Rivarola, E; Silvestri, A.
XPS structural data and correlation with Mossbauer spectra for Tin-organic compounds: adducts of RnSnCl4-n with 1,2-bis(diphenylphosphino)ethane 1-gen-1982 Furlani, C; Mattogno, G; Polzonetti, Giovanni; Mauersberg, P; Rivarola, E; Silvestri, A.
Solid state reactions of RhCl(PPh3)3: an XPS study 1-gen-1982 Furlani, C; Mattogno, G; Polzonetti, Giovanni; Braca, G; Valentini, G.
XPS of coordination compounds: additive ligand effect in some copper (I) and copper (II) chelates with S and P donor ligand 1-gen-1983 Bressan, M; Furlani, C; Polzonetti, Giovanni
Structural characterization by XPS of a series of substituted Ni(II)dithiocarbamates 1-gen-1983 Furlani, C; Polzonetti, Giovanni; Preti, C; Tosi, G.
XPS of coordination compounds: data on the electronic structure of a series of Cu(II)N,N'-cyclic substituted dithiocarbamates 1-gen-1983 Furlani, C; Polzonetti, Giovanni; Preti, C; Tosi, G.
Photoemission study of two model catalysts using synchrotron radiation 1-gen-1985 DI CASTRO, V; Polzonetti, Giovanni; Zanoni, R.
Effects of electron density shift in five-coordinated Pt(II) complexes with olefins. An XPS study 1-gen-1985 Morelli, G; Polzonetti, Giovanni; Sessa, V.
Surface oxidation of Rh(I) catalysts and their models 1-gen-1985 Furlani, C; Mattogno, ; Polzonetti, Giovanni; Sbrana, G; Valentini, G.
SIMS studies of adsorption and reaction at the metal surfaces: correlation with other surface sensitive techniques 1-gen-1985 BRUNDLE C., R; BEHM R., J; Alnot, P; Grimblot, J; Polzonetti, Giovanni; Hopster, H; Wandelt, K.
Photoemission study of Cu/Al interface using synchrotron radiation 1-gen-1986 DI CASTRO, V; Polzonetti, Giovanni
XPS of some Co(II) dithiocarbamates 1-gen-1986 Polzonetti, Giovanni; Preti, C; Tosi, G.
L'ESCA come tecnica di analisi non distruttiva 1-gen-1986 Furlani, C; DI CASTRO, V; Polzonetti, Giovanni
Photoemission study of copper catalyst model using synchrotron radiation 1-gen-1986 DI CASTRO, V; Furlani, C; Polzonetti, Giovanni
Cu growth on Al2O3 and Al: an Auger study 1-gen-1987 DI CASTRO, V; Polzonetti, Giovanni
Thin Cu films on aluminum: a photoemission investigation 1-gen-1987 DI CASTRO, V; Polzonetti, Giovanni
AES analysis of copper growth on MnO 1-gen-1987 DI CASTRO, V; Polzonetti, Giovanni
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