Ruosi, A., Raisch, C., Verna, A., Werner, R., Davidson, B.A., Fujii, J., et al. (2014). Electron sampling depth and saturation effects in perovskite films investigated by soft x-ray absorption spectroscopy. PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS, 90(12), 125120-1-125120-8 [10.1103/PhysRevB.90.125120].

Electron sampling depth and saturation effects in perovskite films investigated by soft x-ray absorption spectroscopy

VERNA, ADRIANO;
2014-01-01

2014
Ruosi, A., Raisch, C., Verna, A., Werner, R., Davidson, B.A., Fujii, J., et al. (2014). Electron sampling depth and saturation effects in perovskite films investigated by soft x-ray absorption spectroscopy. PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS, 90(12), 125120-1-125120-8 [10.1103/PhysRevB.90.125120].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/118784
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