DI GIULIO, A. (2013). Focused Ion Beam/Scanning Electron Microscopy: a new powerful tool for investigating insect morphology at micro- and ultra-structural level. In IBM 2013. Presentations, Posters, abstracts.

Focused Ion Beam/Scanning Electron Microscopy: a new powerful tool for investigating insect morphology at micro- and ultra-structural level

DI GIULIO, ANDREA
2013-01-01

2013
DI GIULIO, A. (2013). Focused Ion Beam/Scanning Electron Microscopy: a new powerful tool for investigating insect morphology at micro- and ultra-structural level. In IBM 2013. Presentations, Posters, abstracts.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/188342
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact