ct—X-ray dosimeters were developed by tailoring novel injecting diamond-like-carbon/Pt/Au contacts on single- crystal high-purity diamond films. A dark resistivity of (5.6 ± 0.1) × 10 14 Ω · cm and no appreciable presence of deep traps in the bandgap confirmed a very low defect density in the diamond films. The dosimeters resulted to be primingless (i.e., no need of preactivation) and characterized by high sensitivity [(58.20 ± 3.26) × 10 − 3 C · Gy − 1 · cm − 3 ] and linear response to X-ray dose rate, produced by a molybdenum target. Transient X-ray modulated analysis allowed the determination of fast-trap influence and the estimation of very fast response times ( ∼ 10 − 3 s), at electric fields ≥ 3 × 10 3 V/cm.
Trucchi, D.M., Allegrini, P., Calvani, P., Galbiati, A., Oliver, K., Conte, G. (2012). Very Fast and Primingless Single-Crystal-Diamond X-Ray Dosimeters. IEEE ELECTRON DEVICE LETTERS, 33, 615-617.
Very Fast and Primingless Single-Crystal-Diamond X-Ray Dosimeters
CONTE, Gennaro
2012-01-01
Abstract
ct—X-ray dosimeters were developed by tailoring novel injecting diamond-like-carbon/Pt/Au contacts on single- crystal high-purity diamond films. A dark resistivity of (5.6 ± 0.1) × 10 14 Ω · cm and no appreciable presence of deep traps in the bandgap confirmed a very low defect density in the diamond films. The dosimeters resulted to be primingless (i.e., no need of preactivation) and characterized by high sensitivity [(58.20 ± 3.26) × 10 − 3 C · Gy − 1 · cm − 3 ] and linear response to X-ray dose rate, produced by a molybdenum target. Transient X-ray modulated analysis allowed the determination of fast-trap influence and the estimation of very fast response times ( ∼ 10 − 3 s), at electric fields ≥ 3 × 10 3 V/cm.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
