Sfoglia per Autore
XPS photoelectron study (ESCA) of some nickel (II) phosphine complexes with catalytic activity in cyclotrimerization reaction of acetylenes
1978-01-01 Furlani, A; Polzonetti, Giovanni; RURRO M., V; Mattogno, G.
Photoelectron spectra (XPS) of sulfur in metal di- and perthiocarboxylates
1978-01-01 CAPECE M., F; Furlani, C; Mattogno, G; Paparazzo, E; Polzonetti, Giovanni
Characterization of palladium-on-alumina catalysts by X-ray photoelectron spectroscopy
1978-01-01 Mattogno, G; Polzonetti, Giovanni; Tauszik, G. R.
Relationship between XPS core binding energies and atomic charge in adducts of Sn (IV) derivatives with pyrazine and comparison with Mossbauer isomer shift
1981-01-01 Furlani, C; Mattogno, G; Polzonetti, Giovanni; Barbieri, R; Rivarola, E; Silvestri, A.
XPS structural data and correlation with Mossbauer spectra for Tin-organic compounds: adducts of RnSnCl4-n with 1,2-bis(diphenylphosphino)ethane
1982-01-01 Furlani, C; Mattogno, G; Polzonetti, Giovanni; Mauersberg, P; Rivarola, E; Silvestri, A.
Solid state reactions of RhCl(PPh3)3: an XPS study
1982-01-01 Furlani, C; Mattogno, G; Polzonetti, Giovanni; Braca, G; Valentini, G.
XPS of coordination compounds: additive ligand effect in some copper (I) and copper (II) chelates with S and P donor ligand
1983-01-01 Bressan, M; Furlani, C; Polzonetti, Giovanni
Structural characterization by XPS of a series of substituted Ni(II)dithiocarbamates
1983-01-01 Furlani, C; Polzonetti, Giovanni; Preti, C; Tosi, G.
XPS of coordination compounds: data on the electronic structure of a series of Cu(II)N,N'-cyclic substituted dithiocarbamates
1983-01-01 Furlani, C; Polzonetti, Giovanni; Preti, C; Tosi, G.
Surface oxidation of Rh(I) catalysts and their models
1985-01-01 Furlani, C; Mattogno, ; Polzonetti, Giovanni; Sbrana, G; Valentini, G.
Effects of electron density shift in five-coordinated Pt(II) complexes with olefins. An XPS study
1985-01-01 Morelli, G; Polzonetti, Giovanni; Sessa, V.
SIMS studies of adsorption and reaction at the metal surfaces: correlation with other surface sensitive techniques
1985-01-01 BRUNDLE C., R; BEHM R., J; Alnot, P; Grimblot, J; Polzonetti, Giovanni; Hopster, H; Wandelt, K.
Photoemission study of two model catalysts using synchrotron radiation
1985-01-01 DI CASTRO, V; Polzonetti, Giovanni; Zanoni, R.
Photoemission study of Cu/Al interface using synchrotron radiation
1986-01-01 DI CASTRO, V; Polzonetti, Giovanni
Photoemission study of copper catalyst model using synchrotron radiation
1986-01-01 DI CASTRO, V; Furlani, C; Polzonetti, Giovanni
L'ESCA come tecnica di analisi non distruttiva
1986-01-01 Furlani, C; DI CASTRO, V; Polzonetti, Giovanni
XPS of some Co(II) dithiocarbamates
1986-01-01 Polzonetti, Giovanni; Preti, C; Tosi, G.
Thin Cu films on aluminum: a photoemission investigation
1987-01-01 DI CASTRO, V; Polzonetti, Giovanni
Cu growth on Al2O3 and Al: an Auger study
1987-01-01 DI CASTRO, V; Polzonetti, Giovanni
AES analysis of copper growth on MnO
1987-01-01 DI CASTRO, V; Polzonetti, Giovanni
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