MUGHAL, MUHAMMAD ZEESHAN

MUGHAL, MUHAMMAD ZEESHAN  

Dipartimento di Ingegneria civile, informatica e delle tecnologie aeronautiche  

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Risultati 1 - 12 di 12 (tempo di esecuzione: 0.038 secondi).
Titolo Data di pubblicazione Autore(i) File
A comparison of microscale techniques for determining fracture toughness of LiMn2O4 particles 1-gen-2017 Mughal, MUHAMMAD ZEESHAN; Amanieu, Hugues Yanis; Moscatelli, Riccardo; Sebastiani, Marco
A method to improve the quality of 2.5 dimensional micro-and nano-structures produced by focused ion beam machining 1-gen-2017 De Felicis, Daniele; Mughal, Muhammad Zeeshan; Bemporad, Edoardo
Anisotropic distribution of the micro residual stresses in lath martensite revealed by FIB ring-core milling technique 1-gen-2018 Archie, Fady; Mughal, Muhammad Zeeshan; Sebastiani, Marco; Bemporad, Edoardo; Zaefferer, Stefan
Damage progression in thermal barrier coating systems during thermal cycling: A nano-mechanical assessment 1-gen-2019 Bolelli, Giovanni; Righi, Maria Grazia; Mughal, Muhammad Zeeshan; Moscatelli, Riccardo; Ligabue, Omar; Antolotti, Nelso; Sebastiani, Marco; Lusvarghi, Luca; Bemporad, Edoardo
Design, fabrication and characterisation of multilayer Cr-CrN thin coatings with tailored residual stress profiles 1-gen-2016 Renzelli, Marco; Mughal, MUHAMMAD ZEESHAN; Sebastiani, Marco; Bemporad, Edoardo
Effect of elastic anisotropy on strain relief and residual stress determination in cubic systems by FIB-DIC experiments 1-gen-2016 Krottenthaler, M.; Benker, L.; Mughal, MUHAMMAD ZEESHAN; Sebastiani, Marco; Durst, K.; Göken, M.
Effect of lithiation on micro-scale fracture toughness of LixMn2O4 cathode 1-gen-2016 Mughal, MUHAMMAD ZEESHAN; Moscatelli, Riccardo; Amanieu, Hugues Yanis; Sebastiani, Marco
Generalised residual stress depth profiling at the nanoscale using focused ion beam milling 1-gen-2019 Salvati, E.; Romano-Brandt, L.; Mughal, M. Z.; Sebastiani, M.; Korsunsky, A. M.
Load displacement and high speed nanoindentation data set at different state of charge (SoC) for spinel LixMn2O4 cathodes 1-gen-2016 Mughal, MUHAMMAD ZEESHAN; Moscatelli, Riccardo; Sebastiani, Marco
Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis 1-gen-2018 Korsunsky, A. M.; Salvati, E.; Lunt, A. G. J.; Sui, T.; Mughal, M. Z.; Daniel, R.; Keckes, J.; Bemporad, E.; Sebastiani, M.
Ni-B electrodeposits with low B content: Effect of DMAB concentration on the internal stresses and the electrochemical behaviour 1-gen-2018 Lekka, M.; Offoiach, R.; Lanzutti, A.; Mughal, M. Z.; Sebastiani, M.; Bemporad, E.; Fedrizzi, L.
Residual stresses and mechanical behavior of nickel-boron coatings 1-gen-2019 Montagne, A.; Vitry, V.; Bonin, L.; Mughal, M. Z.; Sebastiani, M.; Bemporad, E.; Iost, A.; Staia, MARIANA HENRIETTE