In this contribution, we present the employment of a parametric model based procedure to retrieve the effective permittivity and permeability of planar metamaterial samples. The proposed approach is a hybrid procedure exploiting the standard Transmission/Reflection (TR) techniques, usually used to retrieve the effective parameters by a proper combination of the scattering coefficients. The main advantage of this approach relies on the choice of prescribed dispersive models for the involved materials, avoiding the typical issues affecting standard retrieval techniques, like anomalous resonances and non-locality. The implemented algorithm can also be applied to materials with more than one natural resonance.

S., T., Bilotti, F., L., V. (2010). Metamaterial characterization through effective parameter retrieval. In S. Wiak and E. Napieralska-Juszczak (a cura di), Studies in Applied Electromagnetics and Mechanics Series - Vol. 34: Computer Field Models of Electromagnetic Devices (pp. 828-835). Amsterdam : IOS Press.

Metamaterial characterization through effective parameter retrieval

BILOTTI, FILIBERTO;
2010-01-01

Abstract

In this contribution, we present the employment of a parametric model based procedure to retrieve the effective permittivity and permeability of planar metamaterial samples. The proposed approach is a hybrid procedure exploiting the standard Transmission/Reflection (TR) techniques, usually used to retrieve the effective parameters by a proper combination of the scattering coefficients. The main advantage of this approach relies on the choice of prescribed dispersive models for the involved materials, avoiding the typical issues affecting standard retrieval techniques, like anomalous resonances and non-locality. The implemented algorithm can also be applied to materials with more than one natural resonance.
2010
978-1-60750-603-4
S., T., Bilotti, F., L., V. (2010). Metamaterial characterization through effective parameter retrieval. In S. Wiak and E. Napieralska-Juszczak (a cura di), Studies in Applied Electromagnetics and Mechanics Series - Vol. 34: Computer Field Models of Electromagnetic Devices (pp. 828-835). Amsterdam : IOS Press.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/171511
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