Bemporad, E., D., D.F., F., C. (2002). Improving lateral resolution of SEM/EDS observation by the use of advanced TEM sample preparation techniques in the characterisation of nanostructured coatings.

Improving lateral resolution of SEM/EDS observation by the use of advanced TEM sample preparation techniques in the characterisation of nanostructured coatings

BEMPORAD, Edoardo;
2002-01-01

2002
Bemporad, E., D., D.F., F., C. (2002). Improving lateral resolution of SEM/EDS observation by the use of advanced TEM sample preparation techniques in the characterisation of nanostructured coatings.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/190494
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