Sebastiani, M., Bemporad, E., Carassiti, F., Schwarzer, N. (2009). High resolution stress measurement and nanomechanical characterization of thin coatings by Focused Ion Beam (FIB) milling and nanoindentation testing.

High resolution stress measurement and nanomechanical characterization of thin coatings by Focused Ion Beam (FIB) milling and nanoindentation testing

SEBASTIANI, MARCO;BEMPORAD, Edoardo;
2009-01-01

2009
Sebastiani, M., Bemporad, E., Carassiti, F., Schwarzer, N. (2009). High resolution stress measurement and nanomechanical characterization of thin coatings by Focused Ion Beam (FIB) milling and nanoindentation testing.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/191013
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