We present measurements of the resistivity tensor of Bi2Sr2CaCu2O8+delta single crystals with different oxygen concentrations. Sample doping varies from underdoped to slightly overdoped. Measurements are performed through multiterminal technique, which allows for a simultaneous determination of both in-plane and out-of-plane components of the resistivity tensor. Data are analyzed in terms of a model that assumes two different mechanisms for the out-of-plane conduction, markedly thermal activation and incoherent tunneling. Within this model we are able to describe data of normal state resistivity for all samples with different doping levels. We also analyze data from the literature. In all cases, the proposed model describes very well the data in the normal state.

Sarti, S., Fastampa, R., Giura, M., Silva, E. (2002). Resistivity tensor in the normal state of BSCCO single crystals as a function of doping. JOURNAL OF SUPERCONDUCTIVITY, 15(6), 559-562 [10.1023/A:1021243007607].

Resistivity tensor in the normal state of BSCCO single crystals as a function of doping

SILVA, Enrico
2002-01-01

Abstract

We present measurements of the resistivity tensor of Bi2Sr2CaCu2O8+delta single crystals with different oxygen concentrations. Sample doping varies from underdoped to slightly overdoped. Measurements are performed through multiterminal technique, which allows for a simultaneous determination of both in-plane and out-of-plane components of the resistivity tensor. Data are analyzed in terms of a model that assumes two different mechanisms for the out-of-plane conduction, markedly thermal activation and incoherent tunneling. Within this model we are able to describe data of normal state resistivity for all samples with different doping levels. We also analyze data from the literature. In all cases, the proposed model describes very well the data in the normal state.
Sarti, S., Fastampa, R., Giura, M., Silva, E. (2002). Resistivity tensor in the normal state of BSCCO single crystals as a function of doping. JOURNAL OF SUPERCONDUCTIVITY, 15(6), 559-562 [10.1023/A:1021243007607].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/115054
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