We report the performance of an X-ray phase contrast microscope for laboratory sources with 300 nm spatial resolution. The microscope is based on a commercial X-ray microfocus source equipped with a planar X-ray waveguide able to produce a sub-micrometer x-ray beam in one dimension. Phase contrast images of representative samples are reported. The achieved contrast and resolution is discussed for different configurations. The proposed approach could represent a simple, inexpensive, solution for sub-micrometer resolution imaging with small laboratory setups. (C) 2010 Optical Society of America
Pelliccia, D., Sorrentino, A., Bukreeva, I., Cedola, A., Scarinci, F., Ilie, M., et al. (2010). X-ray phase contrast microscopy at 300 nm resolution with laboratory sources RID A-3140-2012 RID C-3783-2011. OPTICS EXPRESS, 18(15), 15998-16004.
X-ray phase contrast microscopy at 300 nm resolution with laboratory sources RID A-3140-2012 RID C-3783-2011
FRATINI, MICHELA;
2010-01-01
Abstract
We report the performance of an X-ray phase contrast microscope for laboratory sources with 300 nm spatial resolution. The microscope is based on a commercial X-ray microfocus source equipped with a planar X-ray waveguide able to produce a sub-micrometer x-ray beam in one dimension. Phase contrast images of representative samples are reported. The achieved contrast and resolution is discussed for different configurations. The proposed approach could represent a simple, inexpensive, solution for sub-micrometer resolution imaging with small laboratory setups. (C) 2010 Optical Society of AmericaI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
