Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, aperture-based infrared SNOM performed in the spectroscopic mode, using the Vanderbilt University free electron laser, started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties. The practical examples presented here show the great potential of this new technique both in materials science and in life sciences. (C) 2004 Elsevier B.V. All rights reserved.

D., V., G., M., J. S., S., P., T., I. D., A., B., I., et al. (2004). Infrared near-field microscopy with the Vanderbilt free electron laser: overview and perspectives. INFRARED PHYSICS & TECHNOLOGY, 45, 409-416 [10.1016/j.infrared.2004.01.007].

Infrared near-field microscopy with the Vanderbilt free electron laser: overview and perspectives

SOMMA, Fabrizia;
2004-01-01

Abstract

Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, aperture-based infrared SNOM performed in the spectroscopic mode, using the Vanderbilt University free electron laser, started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties. The practical examples presented here show the great potential of this new technique both in materials science and in life sciences. (C) 2004 Elsevier B.V. All rights reserved.
2004
D., V., G., M., J. S., S., P., T., I. D., A., B., I., et al. (2004). Infrared near-field microscopy with the Vanderbilt free electron laser: overview and perspectives. INFRARED PHYSICS & TECHNOLOGY, 45, 409-416 [10.1016/j.infrared.2004.01.007].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/116042
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