A near-edge x-ray absorption fine structure (NEXAFS) spectroscopy investigation on the electronic structure of some novel pi-conjugated organometallic polymers is presented. The investigated materials consist of Pt and Pd(II) complex units linked together through sigma-bonded organic spacers of ethynyl-thiophene type in a polymeric array. The C K-edge NEXAFS spectra were interpreted by comparison with literature data and with the spectra of reference samples. The linking between the thiophene rings and alkyne groups produces a splitting of the C1s --> pi* peak observed in the spectra of the thiophene systems. Angle-dependent measurements, performed at normal and grazing incidence of the linearly polarized photons, evidenced a preferential orientation of the polymer chains with an average tilt angle of 45 degrees for the thiophene moieties
Polzonetti, G., Iucci, G., Altamura, P., Ferri, A., Paolucci, G., Goldoni, A., et al. (2002). Thiophene-containing organometallic polymers studied by near-edge X-ray absorption spectroscop. SURFACE AND INTERFACE ANALYSIS, 34, 588-592 [10.1002/sia.1366].
Thiophene-containing organometallic polymers studied by near-edge X-ray absorption spectroscop
IUCCI, GIOVANNA;
2002-01-01
Abstract
A near-edge x-ray absorption fine structure (NEXAFS) spectroscopy investigation on the electronic structure of some novel pi-conjugated organometallic polymers is presented. The investigated materials consist of Pt and Pd(II) complex units linked together through sigma-bonded organic spacers of ethynyl-thiophene type in a polymeric array. The C K-edge NEXAFS spectra were interpreted by comparison with literature data and with the spectra of reference samples. The linking between the thiophene rings and alkyne groups produces a splitting of the C1s --> pi* peak observed in the spectra of the thiophene systems. Angle-dependent measurements, performed at normal and grazing incidence of the linearly polarized photons, evidenced a preferential orientation of the polymer chains with an average tilt angle of 45 degrees for the thiophene moietiesI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
