The interface structure of epitaxial Fe/Cr multilayers was studied using anomalous X-ray and neutron reflectivity. The analysis of X-ray reflectivity at three different energies provided a reliable information about the interface roughnesses. It is found that the Cr-on-Fe interface is more diffused as compared to the Fe-on-Cr interface and that the roughness exhibits a significant increase with increasing depth. The magnetic roughness, as determined from neutron reflectivity, is lower than the geometrical roughness, in conformity with the behavior of a number of magnetic thin films and multilayers.
A., G., A., P., M., G., Meneghini, C., U., P., K., M., et al. (2004). Structural characterization of epitaxial Fe/Cr multilayers using anomalous X-ray and neutron reflectivity. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 272-276, 1219-1220 [10.1016/j.jmmm.2003.12.058].
Structural characterization of epitaxial Fe/Cr multilayers using anomalous X-ray and neutron reflectivity
MENEGHINI, CARLO;
2004-01-01
Abstract
The interface structure of epitaxial Fe/Cr multilayers was studied using anomalous X-ray and neutron reflectivity. The analysis of X-ray reflectivity at three different energies provided a reliable information about the interface roughnesses. It is found that the Cr-on-Fe interface is more diffused as compared to the Fe-on-Cr interface and that the roughness exhibits a significant increase with increasing depth. The magnetic roughness, as determined from neutron reflectivity, is lower than the geometrical roughness, in conformity with the behavior of a number of magnetic thin films and multilayers.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
