Thick epitaxial multilayer silicene films with a √3×√3R(30°) surface structure show only mild surface oxidation after 24 h in air, as measured by Auger electron spectroscopy. X-ray diffraction and Raman spectroscopy measurements performed in air without any protective capping, as well as, for comparison, with a thin Al2O3 cap, showed the (002) reflection and the G, D and 2D Raman structures, which are unique fingerprints of thick multilayer silicene.

De Padova, P., Ottaviani, C., Quaresima, C., Olivieri, B., Imperatori, P., Salomon, E., et al. (2014). 24 H Stability of Thick Multilayer Silicene in Air. 2D MATERIALS, 1 [10.1088/2053-1583/1/2/021003].

24 H Stability of Thick Multilayer Silicene in Air

ROMANO C;Vona A.;
2014

Abstract

Thick epitaxial multilayer silicene films with a √3×√3R(30°) surface structure show only mild surface oxidation after 24 h in air, as measured by Auger electron spectroscopy. X-ray diffraction and Raman spectroscopy measurements performed in air without any protective capping, as well as, for comparison, with a thin Al2O3 cap, showed the (002) reflection and the G, D and 2D Raman structures, which are unique fingerprints of thick multilayer silicene.
De Padova, P., Ottaviani, C., Quaresima, C., Olivieri, B., Imperatori, P., Salomon, E., et al. (2014). 24 H Stability of Thick Multilayer Silicene in Air. 2D MATERIALS, 1 [10.1088/2053-1583/1/2/021003].
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11590/118849
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