Intermixing in Si/Fe/Si trilayer induced by 120 MeV Au ions has been studied. X-ray fluorescence provides information about the depth distribution of Fe atoms, while Mössbauer spectroscopy and XAFS provide information about the changes in the local structure. In the as-deposited film Fe layer is amorphous in nature with a significant Si content in it. Irradiation to a fluence of 1 ×1013 ions/cm2 results in formation of non-magnetic intermixed layer with its hyperfine parameter close to those of Fe0.5Si with CsCl structure. XAFS measurements under X-ray standing wave condition provide depth resolved structural information.
P., R., A., G., Meneghini, C., D. K., A., N., D., I., Z., et al. (2008). depth resolved structural study of heavy ion induced phase formation in Si/Fe/Si trilayer. HYPERFINE INTERACTIONS, 185, 9-15 [10.1007/s10751-008-9804-8].
depth resolved structural study of heavy ion induced phase formation in Si/Fe/Si trilayer
MENEGHINI, CARLO;
2008-01-01
Abstract
Intermixing in Si/Fe/Si trilayer induced by 120 MeV Au ions has been studied. X-ray fluorescence provides information about the depth distribution of Fe atoms, while Mössbauer spectroscopy and XAFS provide information about the changes in the local structure. In the as-deposited film Fe layer is amorphous in nature with a significant Si content in it. Irradiation to a fluence of 1 ×1013 ions/cm2 results in formation of non-magnetic intermixed layer with its hyperfine parameter close to those of Fe0.5Si with CsCl structure. XAFS measurements under X-ray standing wave condition provide depth resolved structural information.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
