We report on a novel solid-state spectrum analyzer in the near infrared. The device is an array of six photodetectors based on polycrystalline germanium film evaporated on a silicon substrate and each element is a wavelength-selective detector. We describe the fabrication and characterization of such device and we demonstrate its capability both as a wavelengthmeter for quasi-monochromatic light beams and as a spectrum analyzer. (C) 2001 Elsevier Science Ltd. All rights reserved.

Colace, L., Masini, G., Galluzzi, F., Assanto, G. (2000). A solid-state near infrared spectrum analyzer based on polycrystalline Ge on Si. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 3(5-6), 545-549 [10.1016/S1369-8001(00)00082-2].

A solid-state near infrared spectrum analyzer based on polycrystalline Ge on Si

COLACE, Lorenzo;ASSANTO, GAETANO
2000-01-01

Abstract

We report on a novel solid-state spectrum analyzer in the near infrared. The device is an array of six photodetectors based on polycrystalline germanium film evaporated on a silicon substrate and each element is a wavelength-selective detector. We describe the fabrication and characterization of such device and we demonstrate its capability both as a wavelengthmeter for quasi-monochromatic light beams and as a spectrum analyzer. (C) 2001 Elsevier Science Ltd. All rights reserved.
2000
Colace, L., Masini, G., Galluzzi, F., Assanto, G. (2000). A solid-state near infrared spectrum analyzer based on polycrystalline Ge on Si. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 3(5-6), 545-549 [10.1016/S1369-8001(00)00082-2].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/120674
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