In this work X-ray photoemission spectroscopy (XPS) and X-ray absorption spectroscopy (XAS) are employed to study the CuPc/Al(1 0 0) organic-inorganic interface. The C ls core level, investigated for three different coverages, shows sharp differences in passing from bulk to monolayer range CuPc film: in particular the shake-up satellite is not visible in the early stages of adsorption, suggesting a strong molecule-substrate interaction. XAS at the Cu L-3 edge was employed to study the molecular orientation with respect to the substrate. In the case of a 40 Angstrom CuPc film the molecular plane was found to be almost perpendicular to the substrate surface. (C) 2004 Elsevier B.V. All rights reserved.

Ruocco, A., Evangelista, F., Attili, A., Donzello, M.p., Betti, M.g., Giovanelli, L., et al. (2004). Copper-phthalocyanine ultra thin films grown onto Al(100) surface investigated by synchrotron radiation. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 137, 165-169 [10.1016/j.elspec.2004.02.092].

Copper-phthalocyanine ultra thin films grown onto Al(100) surface investigated by synchrotron radiation

RUOCCO, Alessandro;
2004

Abstract

In this work X-ray photoemission spectroscopy (XPS) and X-ray absorption spectroscopy (XAS) are employed to study the CuPc/Al(1 0 0) organic-inorganic interface. The C ls core level, investigated for three different coverages, shows sharp differences in passing from bulk to monolayer range CuPc film: in particular the shake-up satellite is not visible in the early stages of adsorption, suggesting a strong molecule-substrate interaction. XAS at the Cu L-3 edge was employed to study the molecular orientation with respect to the substrate. In the case of a 40 Angstrom CuPc film the molecular plane was found to be almost perpendicular to the substrate surface. (C) 2004 Elsevier B.V. All rights reserved.
Ruocco, A., Evangelista, F., Attili, A., Donzello, M.p., Betti, M.g., Giovanelli, L., et al. (2004). Copper-phthalocyanine ultra thin films grown onto Al(100) surface investigated by synchrotron radiation. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 137, 165-169 [10.1016/j.elspec.2004.02.092].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/120726
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