A contouring technique based upon multiple source sandwich speckle photographyis described for measurements of relatively large rms surface roughness. An image processing system for automatic analysis of speckle pattern visibility is used. Some experimental results obtained on plane surfaces of different roughnesses are reported.
Paoletti, D., SCHIRRIPA SPAGNOLO, G. (1991). Multiple Source Sandwich Speckle Photography For Measurement of Surface Roughness. INDUSTRIAL METROLOGY, 1, 343-352 [10.1016/0921-5956(91)80016-9].
Multiple Source Sandwich Speckle Photography For Measurement of Surface Roughness
SCHIRRIPA SPAGNOLO, Giuseppe
1991-01-01
Abstract
A contouring technique based upon multiple source sandwich speckle photographyis described for measurements of relatively large rms surface roughness. An image processing system for automatic analysis of speckle pattern visibility is used. Some experimental results obtained on plane surfaces of different roughnesses are reported.File in questo prodotto:
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