We report on a scanning tunnelling microscope equipped with a piezoelectric inertial slider micropositioner. For any orientation, the proposed device allows an approach down to the tunnelling distance from the tip. The approach process is fully automated by a personal computer that generates the driving signals. Continuous motion at a speed of 5 mm s-1 and single-step advancement down to 50 Å are obtained. The microscope, due to its mechanical symmetry and rigidity, can operate with atomic resolution, using a few stage vibration isolation stacks. The instrument can easily be modified to operate as an atomic force microscope with a fibre-optic-interferometer displacement sensor.

BORDONI F, DE GASPERIS G, DI BATTISTA S, & SCHIRRIPA SPAGNOLO G (1994). A scanning tunnelling microscope with a piezoelectric-driven inertial slider. SENSORS AND ACTUATORS. A, PHYSICAL, 45, 173-178.

A scanning tunnelling microscope with a piezoelectric-driven inertial slider

SCHIRRIPA SPAGNOLO, Giuseppe
1994

Abstract

We report on a scanning tunnelling microscope equipped with a piezoelectric inertial slider micropositioner. For any orientation, the proposed device allows an approach down to the tunnelling distance from the tip. The approach process is fully automated by a personal computer that generates the driving signals. Continuous motion at a speed of 5 mm s-1 and single-step advancement down to 50 Å are obtained. The microscope, due to its mechanical symmetry and rigidity, can operate with atomic resolution, using a few stage vibration isolation stacks. The instrument can easily be modified to operate as an atomic force microscope with a fibre-optic-interferometer displacement sensor.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11590/132808
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