We report on a scanning tunnelling microscope equipped with a piezoelectric inertial slider micropositioner. For any orientation, the proposed device allows an approach down to the tunnelling distance from the tip. The approach process is fully automated by a personal computer that generates the driving signals. Continuous motion at a speed of 5 mm s-1 and single-step advancement down to 50 Å are obtained. The microscope, due to its mechanical symmetry and rigidity, can operate with atomic resolution, using a few stage vibration isolation stacks. The instrument can easily be modified to operate as an atomic force microscope with a fibre-optic-interferometer displacement sensor.
Bordoni, F., DE GASPERIS, G., DI BATTISTA, S., SCHIRRIPA SPAGNOLO, G. (1994). A scanning tunnelling microscope with a piezoelectric-driven inertial slider. SENSORS AND ACTUATORS. A, PHYSICAL, 45, 173-178.
A scanning tunnelling microscope with a piezoelectric-driven inertial slider
SCHIRRIPA SPAGNOLO, Giuseppe
1994-01-01
Abstract
We report on a scanning tunnelling microscope equipped with a piezoelectric inertial slider micropositioner. For any orientation, the proposed device allows an approach down to the tunnelling distance from the tip. The approach process is fully automated by a personal computer that generates the driving signals. Continuous motion at a speed of 5 mm s-1 and single-step advancement down to 50 Å are obtained. The microscope, due to its mechanical symmetry and rigidity, can operate with atomic resolution, using a few stage vibration isolation stacks. The instrument can easily be modified to operate as an atomic force microscope with a fibre-optic-interferometer displacement sensor.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
