A method of contouring three-dimensional objects using an out-of-plane sensitive ESPI apparatus with optical fibers is presented. The contour map is obtained by shifting the object illumination beam. A Fourier transform method is suggested for automatic quantitative analysis of specklecorrelograms in terms of phase. An example of application is presented.
Paoletti, D., SCHIRRIPA SPAGNOLO, G. (1994). Fast Fourier transformed electronic speckle contouring for diffuse surfaces profilometry. OPTICS AND LASERS IN ENGINEERING, 20, 87-96.
Fast Fourier transformed electronic speckle contouring for diffuse surfaces profilometry
SCHIRRIPA SPAGNOLO, Giuseppe
1994-01-01
Abstract
A method of contouring three-dimensional objects using an out-of-plane sensitive ESPI apparatus with optical fibers is presented. The contour map is obtained by shifting the object illumination beam. A Fourier transform method is suggested for automatic quantitative analysis of specklecorrelograms in terms of phase. An example of application is presented.File in questo prodotto:
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