Submicron gate-length metal semiconductor field effect transistors (MESFETs) were fabricated on hydrogen-terminated-large grain polycrystalline diamond. Devices showed high drain-source current (140 ma/mm) and large transconductance values (50 ms/mm), with a cut-off frequency f t = 10 GHz and a maximum oscillation frequency, f max, up to 35 GHz. These values are obtained through the fabrication of devices with geometry and active region dimensions (200-500 nm gate length) compatible with available microelectronic technologies. © 2009 Wiley Periodicals, Inc.

Calvani, P., Corsaro, A., Sinisi, F., Rossi, M.C., Conte, G., Giovine, E., et al. (2009). Microwave operation of sub-Micrometer gate surface channel MESFETs in polycrystalline diamond. MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 51(11), 2786-2788.

Microwave operation of sub-Micrometer gate surface channel MESFETs in polycrystalline diamond

ROSSI, Maria Cristina;Conte, G;
2009-01-01

Abstract

Submicron gate-length metal semiconductor field effect transistors (MESFETs) were fabricated on hydrogen-terminated-large grain polycrystalline diamond. Devices showed high drain-source current (140 ma/mm) and large transconductance values (50 ms/mm), with a cut-off frequency f t = 10 GHz and a maximum oscillation frequency, f max, up to 35 GHz. These values are obtained through the fabrication of devices with geometry and active region dimensions (200-500 nm gate length) compatible with available microelectronic technologies. © 2009 Wiley Periodicals, Inc.
2009
Calvani, P., Corsaro, A., Sinisi, F., Rossi, M.C., Conte, G., Giovine, E., et al. (2009). Microwave operation of sub-Micrometer gate surface channel MESFETs in polycrystalline diamond. MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 51(11), 2786-2788.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/133833
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