Documents have taken up a very important place in our society. Frauds committed in connection with documents are not at all uncommon, and, in fact, represent a very large domain of the forensic science called “questioned documents”. In the field of forensic examination of questioned documents, the legitimacy of an ink entry is often an essential question. A common type of forgery consists in materially altering an existing writing or adding a new writing. These changes can be characterized by means of optical spectroscopy. The aim of this work is to perform the UV-vis-NIR reflectance spectrophotometry to analyze a range of blue and black commercial ballpoint pens, in order to investigate the discriminating abilities of the different inks found on the same document.

Somma, F., Aloe, P., SCHIRRIPA SPAGNOLO, G. (2010). Defects in UV-vis-NIR reflectance spectra as method for forgery detections in writing documents. JOURNAL OF PHYSICS. CONFERENCE SERIES, 249(012060), 1-4 [10.1088/1742-6596/249/1/012060].

Defects in UV-vis-NIR reflectance spectra as method for forgery detections in writing documents

SOMMA, Fabrizia;ALOE P;SCHIRRIPA SPAGNOLO, Giuseppe
2010-01-01

Abstract

Documents have taken up a very important place in our society. Frauds committed in connection with documents are not at all uncommon, and, in fact, represent a very large domain of the forensic science called “questioned documents”. In the field of forensic examination of questioned documents, the legitimacy of an ink entry is often an essential question. A common type of forgery consists in materially altering an existing writing or adding a new writing. These changes can be characterized by means of optical spectroscopy. The aim of this work is to perform the UV-vis-NIR reflectance spectrophotometry to analyze a range of blue and black commercial ballpoint pens, in order to investigate the discriminating abilities of the different inks found on the same document.
Somma, F., Aloe, P., SCHIRRIPA SPAGNOLO, G. (2010). Defects in UV-vis-NIR reflectance spectra as method for forgery detections in writing documents. JOURNAL OF PHYSICS. CONFERENCE SERIES, 249(012060), 1-4 [10.1088/1742-6596/249/1/012060].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/134364
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