This design note describes an optoelectronic technique able to obtain the surface topography. The sensor is based on a new fringe projection system, which uses a phase diffraction grating. The proposed system is simple, compact, robust and easy to use.

SCHIRRIPA SPAGNOLO, G., Ambrosini, D. (2001). Surface contouring by diffractive optical element-based fringe projection. MEASUREMENT SCIENCE & TECHNOLOGY, 12, N6-N8 [10.1088/0957-0233/12/1/402].

Surface contouring by diffractive optical element-based fringe projection

SCHIRRIPA SPAGNOLO, Giuseppe;
2001-01-01

Abstract

This design note describes an optoelectronic technique able to obtain the surface topography. The sensor is based on a new fringe projection system, which uses a phase diffraction grating. The proposed system is simple, compact, robust and easy to use.
2001
SCHIRRIPA SPAGNOLO, G., Ambrosini, D. (2001). Surface contouring by diffractive optical element-based fringe projection. MEASUREMENT SCIENCE & TECHNOLOGY, 12, N6-N8 [10.1088/0957-0233/12/1/402].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/134484
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