Benvenuti nell'Anagrafe della Ricerca d'Ateneo
La valutazione delle attività di ricerca che si svolgono nelle università ha assunto un'importanza rilevante sia per l'intero sistema universitario sia all'interno di ogni singolo ateneo. Roma Tre si è quindi dotata di idonei strumenti informativi in grado di supportare al meglio le azioni di monitoraggio e di valutazione delle attività di ricerca svolte nei propri dipartimentied ha realizzato una Anagrafe della Ricerca di Ateneo.
EnglishWe study the effect of the substrate on the effective surface impedance of a YBa2Cu3O7-delta thin film grown over a silicon substrate. The microwave measurements, performed with a resonant cavity technique at two distinct frequencies (24 and 48 GHz), show anomalies both in the temperature and in the frequency dependences. By properly taking into account a relevant complex substrate contribution, with an important role played by the finite thickness effect, the whole set of data finds a satisfactory explanation in terms of standard impedance transformations. Using independent measurements at a single temperature, it is possible to extract the temperature dependence of the YBa2Cu3O7-delta bulk surface impedance, which shows the expected frequency and temperature behaviours.
Pompeo N, Marcon R, Mechin L, & Silva E (2005). Effective surface impedance of YBa2CU3O7-delta films on silicon substrates RID B-6088-2008. SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 18(4), 531-537 [10.1088/0953-2048/18/4/025].
| Titolo: | Effective surface impedance of YBa2CU3O7-delta films on silicon substrates RID B-6088-2008 | |
| Autori: | ||
| Data di pubblicazione: | 2005 | |
| Rivista: | ||
| Citazione: | Pompeo N, Marcon R, Mechin L, & Silva E (2005). Effective surface impedance of YBa2CU3O7-delta films on silicon substrates RID B-6088-2008. SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 18(4), 531-537 [10.1088/0953-2048/18/4/025]. | |
| Abstract: | We study the effect of the substrate on the effective surface impedance of a YBa2Cu3O7-delta thin film grown over a silicon substrate. The microwave measurements, performed with a resonant cavity technique at two distinct frequencies (24 and 48 GHz), show anomalies both in the temperature and in the frequency dependences. By properly taking into account a relevant complex substrate contribution, with an important role played by the finite thickness effect, the whole set of data finds a satisfactory explanation in terms of standard impedance transformations. Using independent measurements at a single temperature, it is possible to extract the temperature dependence of the YBa2Cu3O7-delta bulk surface impedance, which shows the expected frequency and temperature behaviours. | |
| Handle: | http://hdl.handle.net/11590/135207 | |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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