XPS investigation of the early stages of Cu/PPA interface formation has been performed in the range of coverage 0.5 divided-by 13angstrom Cu. Copper is found to grow in a layer-by-layer mode without interdiffusion with the substrate. Weak chemical interaction between Cu and the pi ring electrons of the phenyl groups is evidenced by monitoring the changes occurring at the C 1s secondary structure pi-->pi* shake up transition.
Polzonetti, G., Russo, M.v., Iucci, G., Furlani, A. (1993). Cu/ Polyphenylacetylene interface investigated by means of XPS. SYNTHETIC METALS, 55/57, 165-170 [10.1016/0379-6779(93)90927-O].
Cu/ Polyphenylacetylene interface investigated by means of XPS
IUCCI, GIOVANNA;
1993-01-01
Abstract
XPS investigation of the early stages of Cu/PPA interface formation has been performed in the range of coverage 0.5 divided-by 13angstrom Cu. Copper is found to grow in a layer-by-layer mode without interdiffusion with the substrate. Weak chemical interaction between Cu and the pi ring electrons of the phenyl groups is evidenced by monitoring the changes occurring at the C 1s secondary structure pi-->pi* shake up transition.File in questo prodotto:
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