Surface roughness evaluation is very important to characterize surface finish. Roughness parameter can be calculated in either two-dimensional (2D) or three-dimensional (3D) form. 2D profile analysis has been widely used in science and engineering for more than half century. In recent years, there was an increases need for 3D surface analysis. The aim of this paper is to present a new optoelectronic system based on two lasers diode for 3D real-time surface roughness measurement. 3D surface roughness parameter (Sq), of a surface characterized by a stationary Gaussian random process, is estimated using Spectral Speckle Correlation (SSC). In the paper, theory is described and experimental results are given.
L., C., SCHIRRIPA SPAGNOLO, G., Leccese, F. (2014). Viability of an Optoelectronic System for Real Time Roughness Measurement. MEASUREMENT, 58, 537-543 [10.1016/j.measurement.2014.09.018].
Viability of an Optoelectronic System for Real Time Roughness Measurement
SCHIRRIPA SPAGNOLO, Giuseppe;LECCESE, Fabio
2014-01-01
Abstract
Surface roughness evaluation is very important to characterize surface finish. Roughness parameter can be calculated in either two-dimensional (2D) or three-dimensional (3D) form. 2D profile analysis has been widely used in science and engineering for more than half century. In recent years, there was an increases need for 3D surface analysis. The aim of this paper is to present a new optoelectronic system based on two lasers diode for 3D real-time surface roughness measurement. 3D surface roughness parameter (Sq), of a surface characterized by a stationary Gaussian random process, is estimated using Spectral Speckle Correlation (SSC). In the paper, theory is described and experimental results are given.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
