The purpose of this discussion is to point out some similarities between a paper that was recently published by J.G. Zhu et al. [1] and a paper that we published earlier on the same subject [2]. The micro-scale FIB-DIC ring core technique was first proposed in 2009 [3]. The attraction of this method lies in its compatibility with well-established experimental facilities and interpretation procedures, and its applicability to stiff and compliant, crystalline and amorphous materials alike. The technique utilizes a combination of material removal and imaging capabilities of focused ion beam and dual-beam microscopes. This allows highly spatially resolved residual stress measurements to be performed with sub-micron lateral spatial resolution [4] and depth profiling with a resolution of ~100 nm [2].
Sebastiani, M., Korsunsky A., M., Eberl, C., Bemporad, E., Pharr, G.M. (2014). Discussion on “Interfacial Residual Stress Analysis of Thermal Spray Coatings by Miniature Ring-Core Cutting Combined with DIC Method”. EXPERIMENTAL MECHANICS, 54(7), 1305-1306 [10.1007/s11340-014-9912-0].
Discussion on “Interfacial Residual Stress Analysis of Thermal Spray Coatings by Miniature Ring-Core Cutting Combined with DIC Method”
SEBASTIANI, MARCO;BEMPORAD, Edoardo;
2014-01-01
Abstract
The purpose of this discussion is to point out some similarities between a paper that was recently published by J.G. Zhu et al. [1] and a paper that we published earlier on the same subject [2]. The micro-scale FIB-DIC ring core technique was first proposed in 2009 [3]. The attraction of this method lies in its compatibility with well-established experimental facilities and interpretation procedures, and its applicability to stiff and compliant, crystalline and amorphous materials alike. The technique utilizes a combination of material removal and imaging capabilities of focused ion beam and dual-beam microscopes. This allows highly spatially resolved residual stress measurements to be performed with sub-micron lateral spatial resolution [4] and depth profiling with a resolution of ~100 nm [2].I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.