It is demonstrated that interface structure in thin film nanostructures can be studied with a depth resolution of a fraction of a nanometer by using x-ray standing waves generated by a multilayer mirror used as a substrate. Two interfaces of a few nm thick Fe layer in magnetic trilayer structures Tb∕Fe∕Tb and Cr∕Fe∕Cr could be clearly resolved using x-ray standing waves generated by an underlying W∕Si multilayer mirror. It is found that in both the cases rms roughness of the two interfaces Fe-on-Tb(Cr) and Tb(Cr)-on-Fe are not equal. For example, roughness of Fe-on-Tb interface is 1.2 nm, while that of Tb-on-Fe interface is 0.7 nm. The technique is particularly suitable in systems in which x-ray scattering contrast between adjacent layers is poor.
A., G., D., K., Meneghini, C. (2007). Study of interface structure in magnetic multilayers using standing waves. PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS, 75, 064424 [10.1103/PhysRevB.75.064424].
Study of interface structure in magnetic multilayers using standing waves
MENEGHINI, CARLO
2007-01-01
Abstract
It is demonstrated that interface structure in thin film nanostructures can be studied with a depth resolution of a fraction of a nanometer by using x-ray standing waves generated by a multilayer mirror used as a substrate. Two interfaces of a few nm thick Fe layer in magnetic trilayer structures Tb∕Fe∕Tb and Cr∕Fe∕Cr could be clearly resolved using x-ray standing waves generated by an underlying W∕Si multilayer mirror. It is found that in both the cases rms roughness of the two interfaces Fe-on-Tb(Cr) and Tb(Cr)-on-Fe are not equal. For example, roughness of Fe-on-Tb interface is 1.2 nm, while that of Tb-on-Fe interface is 0.7 nm. The technique is particularly suitable in systems in which x-ray scattering contrast between adjacent layers is poor.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
