Polycrystalline NaF films were grown by e-beam assisted physical evaporation on amorphous silica substrates kept, during film growth, at constant temperatures ranging from 40 degrees C to 400 degrees C. The structural characterization of the films was performed by X-ray diffraction and by scanning electron microscopy. Irradiating the films with a 15 keV electron beam induced the formation of F and F-aggregate colour centres stable at room temperature. Absorption and photoemission measurements were performed and indicated a dependence of coloration on the deposition conditions.

Cremona, M., Sotero, A.p., Nunes, R.a., Mauricio, M., Docarmo, L., Montereali, R.m., et al. (1995). NaF films: Growth properties and electron beam induced defects. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 136(1-4), 163-167 [10.1080/10420159508218814].

NaF films: Growth properties and electron beam induced defects

SOMMA, Fabrizia
1995-01-01

Abstract

Polycrystalline NaF films were grown by e-beam assisted physical evaporation on amorphous silica substrates kept, during film growth, at constant temperatures ranging from 40 degrees C to 400 degrees C. The structural characterization of the films was performed by X-ray diffraction and by scanning electron microscopy. Irradiating the films with a 15 keV electron beam induced the formation of F and F-aggregate colour centres stable at room temperature. Absorption and photoemission measurements were performed and indicated a dependence of coloration on the deposition conditions.
1995
Cremona, M., Sotero, A.p., Nunes, R.a., Mauricio, M., Docarmo, L., Montereali, R.m., et al. (1995). NaF films: Growth properties and electron beam induced defects. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 136(1-4), 163-167 [10.1080/10420159508218814].
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/143539
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 1
  • ???jsp.display-item.citation.isi??? 6
social impact