A new optoelectronic system based on a projection unit in which light, coming from a laser diode coupled to an optic fiber impinges on a diffractive optical element (DOE) to produce sinusoidal fringes is proposed for three-dimensional (3-D) texture measurement. If the projected fringe pattern is viewed at an angle different from the projection angle, the fringe profile is phase-modulated by the 3-D object shape. The 3-D map information is obtained with the aid of a fringe analyzer based on phase-shifting synthetic moiré pattern, Fast Fourier Transform (FFT), signal demodulation techniques and a robust and fast phase unwrapping performed by a specially developed software. The proposed system is based on a simple and low-cost equipment; furthermore, it is suitable for in situ measurements also by non-skilled operators. Some experimental examples illustrate its performance.

SCHIRRIPA SPAGNOLO, G., Ambrosini, D., Paoletti, D. (2004). Low-Cost Optoelectronic System for Three-Dimensional Artwork Texture Measurement. IEEE TRANSACTIONS ON IMAGE PROCESSING, 13, 390-396 [10.1109/TIP.2003.821116].

Low-Cost Optoelectronic System for Three-Dimensional Artwork Texture Measurement

SCHIRRIPA SPAGNOLO, Giuseppe;
2004-01-01

Abstract

A new optoelectronic system based on a projection unit in which light, coming from a laser diode coupled to an optic fiber impinges on a diffractive optical element (DOE) to produce sinusoidal fringes is proposed for three-dimensional (3-D) texture measurement. If the projected fringe pattern is viewed at an angle different from the projection angle, the fringe profile is phase-modulated by the 3-D object shape. The 3-D map information is obtained with the aid of a fringe analyzer based on phase-shifting synthetic moiré pattern, Fast Fourier Transform (FFT), signal demodulation techniques and a robust and fast phase unwrapping performed by a specially developed software. The proposed system is based on a simple and low-cost equipment; furthermore, it is suitable for in situ measurements also by non-skilled operators. Some experimental examples illustrate its performance.
2004
SCHIRRIPA SPAGNOLO, G., Ambrosini, D., Paoletti, D. (2004). Low-Cost Optoelectronic System for Three-Dimensional Artwork Texture Measurement. IEEE TRANSACTIONS ON IMAGE PROCESSING, 13, 390-396 [10.1109/TIP.2003.821116].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/149316
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