A novel solid-stale device for the spectral analysis of near infrared light is presented. The device is an array of six photodetectors in polycrystalline Ge on Si, each element being wavelength selective. The fabrication, characterisation and demonstration of the device both as a wavelength meter and spectrum analyser are presented.
Masini, G., Colace, L., Assanto, G. (1999). Near infrared wavemeter in polycrystalline germanium on silicon. ELECTRONICS LETTERS, 35(18), 1549-1551 [10.1049/el:19991011].
Near infrared wavemeter in polycrystalline germanium on silicon
COLACE, Lorenzo;ASSANTO, GAETANO
1999-01-01
Abstract
A novel solid-stale device for the spectral analysis of near infrared light is presented. The device is an array of six photodetectors in polycrystalline Ge on Si, each element being wavelength selective. The fabrication, characterisation and demonstration of the device both as a wavelength meter and spectrum analyser are presented.File in questo prodotto:
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