Benvenuti nell'Anagrafe della Ricerca d'Ateneo
La valutazione delle attività di ricerca che si svolgono nelle università ha assunto un'importanza rilevante sia per l'intero sistema universitario sia all'interno di ogni singolo ateneo. Roma Tre si è quindi dotata di idonei strumenti informativi in grado di supportare al meglio le azioni di monitoraggio e di valutazione delle attività di ricerca svolte nei propri dipartimentied ha realizzato una Anagrafe della Ricerca di Ateneo.
EnglishThreshold photoemission spectroscopy (TPES) is used to measure the Fe 2p spectrum of a stainless steel sample. The obtained spectrum is compared with analogous spectra measured by X-ray photoemission and absorption spectroscopies. The results of this comparison suggest that resonant two-electron autoionization processes, rather than direct photoemission from the core level, are the main mechanisms contributing to the signal. Limits and applicability of this experimental approach to investigate bulk electronic properties in solids are discussed.
Offi F, Avaldi L, Camilloni R, Dawber G, King GC, & Stefani G (2007). Threshold photoernission spectroscopy in solids. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 154(3), 63-68.
| Titolo: | Threshold photoernission spectroscopy in solids |
| Autori: | |
| Data di pubblicazione: | 2007 |
| Rivista: | |
| Citazione: | Offi F, Avaldi L, Camilloni R, Dawber G, King GC, & Stefani G (2007). Threshold photoernission spectroscopy in solids. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 154(3), 63-68. |
| Abstract: | Threshold photoemission spectroscopy (TPES) is used to measure the Fe 2p spectrum of a stainless steel sample. The obtained spectrum is compared with analogous spectra measured by X-ray photoemission and absorption spectroscopies. The results of this comparison suggest that resonant two-electron autoionization processes, rather than direct photoemission from the core level, are the main mechanisms contributing to the signal. Limits and applicability of this experimental approach to investigate bulk electronic properties in solids are discussed. |
| Handle: | http://hdl.handle.net/11590/153593 |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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