Bemporad, E., Carassiti, F. (2003). Multiscale integration in microscopy characterization techniques: a powerful approach to solve thick and thin complex coating systems; some case studies. REVISTA DE LA FACULTAD DE INGENIERÍA.

Multiscale integration in microscopy characterization techniques: a powerful approach to solve thick and thin complex coating systems; some case studies

BEMPORAD, Edoardo;
2003-01-01

2003
Bemporad, E., Carassiti, F. (2003). Multiscale integration in microscopy characterization techniques: a powerful approach to solve thick and thin complex coating systems; some case studies. REVISTA DE LA FACULTAD DE INGENIERÍA.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/156724
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 0
  • ???jsp.display-item.citation.isi??? ND
social impact