In addition to its well-known capabilities in imaging and spectroscopy, scanning probe microscopy (SPM) has recently shown great potentials for patterning of material structures in nanoscales. It has drawn the attention of not only the scientific community, but also the industry. This article examines various applications of SPM in modification, deposition, removal, and manipulation of materials for nanoscale fabrication. The SPM-based nanofabrication involves two basic technologies: scanning tunneling microscopy and atomic force microscopy. Major techniques related to these two technologies are evaluated with emphasis on their abilities, efficiencies, and reliabilities to make nanostructures. The principle and specific approach underlying each technique are presented; the differences and uniqueness among these techniques are subsequently discussed. Finally, concluding remarks are provided where the strength and weakness of the techniques studied are summarized and the scopes for technology improvement and future research are recommended

Tseng, A.A., Notargiacomo, A., Chen, T.P. (2005). Nanofabrication by scanning probe microscope lithography: A review, 23, 877.

Nanofabrication by scanning probe microscope lithography: A review

NOTARGIACOMO, Andrea;
2005

Abstract

In addition to its well-known capabilities in imaging and spectroscopy, scanning probe microscopy (SPM) has recently shown great potentials for patterning of material structures in nanoscales. It has drawn the attention of not only the scientific community, but also the industry. This article examines various applications of SPM in modification, deposition, removal, and manipulation of materials for nanoscale fabrication. The SPM-based nanofabrication involves two basic technologies: scanning tunneling microscopy and atomic force microscopy. Major techniques related to these two technologies are evaluated with emphasis on their abilities, efficiencies, and reliabilities to make nanostructures. The principle and specific approach underlying each technique are presented; the differences and uniqueness among these techniques are subsequently discussed. Finally, concluding remarks are provided where the strength and weakness of the techniques studied are summarized and the scopes for technology improvement and future research are recommended
Tseng, A.A., Notargiacomo, A., Chen, T.P. (2005). Nanofabrication by scanning probe microscope lithography: A review, 23, 877.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/269855
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