"The deposition and characterization of La2Zr2O7 thin films deposited by metal-organic decomposition method on both single crystal SrTiO3 and cube textured Ni-5 at.%W substrates are presented. Metal acetylacetonates in propionic acid solution was used. The results showed that LZO films are epitaxially grown with smooth surface with rms roughness around 2 nm. YBa2Cu3O7-δ films, deposited by pulsed laser deposition technique on LZO buffer layers, showed critical temperature of 90 K and critical current density in self magnetic field Jc = 1.6 and 13 MA\/cm2 at 77 K and 4.2 K, respectively. A better Jc retention in magnetic field for YBCO films deposited on LZO\/STO than YBCO on bare STO is observed indicating a rather strong vortex pinning as confirmed by microwave measurements."

Angrisani Armenio, A., Augieri, A., Fabbri, F., Freda, R., Galluzzi, V., Mancini, A., et al. (2012). Growth and characterization of La2Zr2O7 buffer layers deposited by chemical solution deposition. PHYSICS PROCEDIA, 36, 1552-1557 [10.1016/j.phpro.2012.06.209].

Growth and characterization of La2Zr2O7 buffer layers deposited by chemical solution deposition

SOTGIU, Giovanni;POMPEO, NICOLA;TOROKHTII, KOSTIANTYN;BEMPORAD, Edoardo;
2012-01-01

Abstract

"The deposition and characterization of La2Zr2O7 thin films deposited by metal-organic decomposition method on both single crystal SrTiO3 and cube textured Ni-5 at.%W substrates are presented. Metal acetylacetonates in propionic acid solution was used. The results showed that LZO films are epitaxially grown with smooth surface with rms roughness around 2 nm. YBa2Cu3O7-δ films, deposited by pulsed laser deposition technique on LZO buffer layers, showed critical temperature of 90 K and critical current density in self magnetic field Jc = 1.6 and 13 MA\/cm2 at 77 K and 4.2 K, respectively. A better Jc retention in magnetic field for YBCO films deposited on LZO\/STO than YBCO on bare STO is observed indicating a rather strong vortex pinning as confirmed by microwave measurements."
Angrisani Armenio, A., Augieri, A., Fabbri, F., Freda, R., Galluzzi, V., Mancini, A., et al. (2012). Growth and characterization of La2Zr2O7 buffer layers deposited by chemical solution deposition. PHYSICS PROCEDIA, 36, 1552-1557 [10.1016/j.phpro.2012.06.209].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/278762
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