The best possible precision is one of the key figures in metrology, but this is established by the exact response of the detection apparatus, which is often unknown. There exist techniques for detector characterization that have been introduced in the context of quantum technologies but apply as well for ordinary classical coherence; these techniques, though, rely on intense data processing. Here, we show that one can make use of the simpler approach of data fitting patterns in order to obtain an estimate of the Cramér-Rao bound allowed by an unknown detector, and we present applications in polarimetry. Further, we show how this formalism provides a useful calculation tool in an estimation problem involving a continuous-variable quantum state, i.e., a quantum harmonic oscillator.
Altorio, M., Genoni, M.G., Somma, F., & Barbieri, M. (2016). Metrology with Unknown Detectors. PHYSICAL REVIEW LETTERS, 116(10) [10.1103/PhysRevLett.116.100802].
|Titolo:||Metrology with Unknown Detectors|
|Data di pubblicazione:||2016|
|Citazione:||Altorio, M., Genoni, M.G., Somma, F., & Barbieri, M. (2016). Metrology with Unknown Detectors. PHYSICAL REVIEW LETTERS, 116(10) [10.1103/PhysRevLett.116.100802].|
|Appare nelle tipologie:||1.1 Articolo in rivista|