The scattering cancellation technique is a powerful tool to reduce the scattered field from electrically small objects in a specific frequency window. The technique relies on covering the object of interest with a shell that scatters light into a far field of equal strength as the object but with a phase shift of π. The resulting destructive interference prohibits its detection in measurements that probe the scattered light. Whereas at radio or microwave frequencies feasible designs have been proposed that allow us to tune the operational frequency upon request, similar capabilities have not yet been explored in the visible. However, such an ability is necessary to capitalize on the technique in many envisioned applications. Here, we solve the problem and study the use of small metallic nanoparticles with an ellipsoidal shape as the material from which the shell is made to build an isotropic geometry. Changing the aspect ratio of the ellipsoids allows us to change the operational frequency. The basic functionality is explored with two complementary analytical approaches. Additionally, we present a powerful multiscattering algorithm that can be used to perform full-wave simulations of clusters of arbitrary particles. We utilize this method to analyze the scattering of the presented designs numerically. Herein we provide useful guidelines for the fabrication of this cloak with self-assembly methods by investigating the effects of disorder.
Fruhnert Martin, Monti Alessio, Fernandez-Corbaton Ivan, Alù Andrea, Toscano Alessandro, Bilotti Filiberto, et al. (2016). Tunable scattering cancellation cloak with plasmonic ellipsoids in the visible. PHYSICAL REVIEW. B, 93(24), 245127.
|Titolo:||Tunable scattering cancellation cloak with plasmonic ellipsoids in the visible|
|Data di pubblicazione:||2016|
|Citazione:||Fruhnert Martin, Monti Alessio, Fernandez-Corbaton Ivan, Alù Andrea, Toscano Alessandro, Bilotti Filiberto, et al. (2016). Tunable scattering cancellation cloak with plasmonic ellipsoids in the visible. PHYSICAL REVIEW. B, 93(24), 245127.|
|Appare nelle tipologie:||1.1 Articolo in rivista|