The space-charge effect, due to the instantaneous emission of many electrons after the absorption of a single photons pulse, causes distortion in the, photoelectron energy spectrum. Two calculation methods have been applied to simulate the expansion during a free flight of clouds of mono- and bi-energetic electrons generated by a high energy pulse of light and their results have been compared. The accuracy of a widely used tool, such as SIMION (R), in predicting, the energy distortion caused by the space-charge has been tested and the reliability of its results is verified. Finally we used SIMION (R) to take into account the space-charge effects in the simulation of simple photoemission experiments with a time-of-flight analyzer. (C) 2016 Elsevier B.V. All rights reserved.
Greco, G., Verna, A., Offi, F., Stefani, G. (2016). Space-charge effect in electron time-of-flight analyzer for high-energy photoemission spectroscopy. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 212, 86-93 [10.1016/j.elspec.2016.09.004].
Space-charge effect in electron time-of-flight analyzer for high-energy photoemission spectroscopy
GRECO, GIORGIA;VERNA, ADRIANO;OFFI, FRANCESCO;STEFANI, Giovanni
2016-01-01
Abstract
The space-charge effect, due to the instantaneous emission of many electrons after the absorption of a single photons pulse, causes distortion in the, photoelectron energy spectrum. Two calculation methods have been applied to simulate the expansion during a free flight of clouds of mono- and bi-energetic electrons generated by a high energy pulse of light and their results have been compared. The accuracy of a widely used tool, such as SIMION (R), in predicting, the energy distortion caused by the space-charge has been tested and the reliability of its results is verified. Finally we used SIMION (R) to take into account the space-charge effects in the simulation of simple photoemission experiments with a time-of-flight analyzer. (C) 2016 Elsevier B.V. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.