A detailed characterization under 90Sr β-particles and 4.5MeV protons micro-beam of a single-crystal CVD diamond-based three-dimensional detector with surface and buried graphite electrodes is presented. Pillar contacts, 300μm long and 30μm diameter, were fabricated by using a femtosecond laser operating at 1030nm wavelength and 400fs pulse duration. Charge collected under 90Sr β-particles was measured in front and back irradiation conditions, pointing out that the pillars contribute to the charge collection. Charge collection efficiency (CCE) was measured to be up to 94% under proton beam irradiation. Results of a comprehensive study, including crossed-polarizers imaging, numerical simulation of the electric field distribution, and proton mapping, show that CCE is not affected from the stress induced by the pillar fabrication, and that the electric field strength is high enough to partially compensate for carrier recombination in the defected regions surrounding the pillars.
Girolami, M., Conte, G., Trucchi, D.M., Bellucci, A., Oliva, P., Kononenko, T., et al. (2018). Investigation with β-particles and protons of buried graphite pillars in single-crystal CVD diamond. DIAMOND AND RELATED MATERIALS, 84, 1-10.
Investigation with β-particles and protons of buried graphite pillars in single-crystal CVD diamond
M. Girolami
;G. ConteSupervision
;D. M. TrucchiMembro del Collaboration Group
;P. OlivaMembro del Collaboration Group
;V. RalchenkoMembro del Collaboration Group
;S. SalvatoriMembro del Collaboration Group
2018-01-01
Abstract
A detailed characterization under 90Sr β-particles and 4.5MeV protons micro-beam of a single-crystal CVD diamond-based three-dimensional detector with surface and buried graphite electrodes is presented. Pillar contacts, 300μm long and 30μm diameter, were fabricated by using a femtosecond laser operating at 1030nm wavelength and 400fs pulse duration. Charge collected under 90Sr β-particles was measured in front and back irradiation conditions, pointing out that the pillars contribute to the charge collection. Charge collection efficiency (CCE) was measured to be up to 94% under proton beam irradiation. Results of a comprehensive study, including crossed-polarizers imaging, numerical simulation of the electric field distribution, and proton mapping, show that CCE is not affected from the stress induced by the pillar fabrication, and that the electric field strength is high enough to partially compensate for carrier recombination in the defected regions surrounding the pillars.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.