We present results of an x-ray study of structural properties of π-π conjugated networks in semicrystalline polymer thin films using nanofocused x-ray beam. We applied the x-ray cross-correlation analysis to x-ray scattering data from blends of poly(3-hexylthiophene) (P3HT) with gold nanoparticles. The Fourier spectra of the intensity cross-correlation functions for different films contain non-zero components of orders n = 2,4 and 6 revealing structural order in the system. The results suggest inhomogeneous structure of both samples, with preferential edge-on orientation of domains in one sample and mixed orientation in another sample. © Published under licence by IOP Publishing Ltd.

Kurta, R.P., Grodd, L., Mikayelyan, E., Gorobtsov, O.Y., Fratoddi, I., Venditti, I., et al. (2014). Structural properties of π-π Conjugated network in polymer thin films studied by x-ray cross-correlation analysis. JOURNAL OF PHYSICS. CONFERENCE SERIES, 499(1), 012021 [10.1088/1742-6596/499/1/012021].

Structural properties of π-π Conjugated network in polymer thin films studied by x-ray cross-correlation analysis

Venditti I.
Membro del Collaboration Group
;
2014-01-01

Abstract

We present results of an x-ray study of structural properties of π-π conjugated networks in semicrystalline polymer thin films using nanofocused x-ray beam. We applied the x-ray cross-correlation analysis to x-ray scattering data from blends of poly(3-hexylthiophene) (P3HT) with gold nanoparticles. The Fourier spectra of the intensity cross-correlation functions for different films contain non-zero components of orders n = 2,4 and 6 revealing structural order in the system. The results suggest inhomogeneous structure of both samples, with preferential edge-on orientation of domains in one sample and mixed orientation in another sample. © Published under licence by IOP Publishing Ltd.
2014
Kurta, R.P., Grodd, L., Mikayelyan, E., Gorobtsov, O.Y., Fratoddi, I., Venditti, I., et al. (2014). Structural properties of π-π Conjugated network in polymer thin films studied by x-ray cross-correlation analysis. JOURNAL OF PHYSICS. CONFERENCE SERIES, 499(1), 012021 [10.1088/1742-6596/499/1/012021].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/354329
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