Dielectric loaded resonators, by virtue of their high sensitivity, are a de facto standard for the measurement of the microwave surface impedance Z of good conductors, including superconductors. However, new perspective applications of superconductors request measurements in increasingly extreme conditions: cryogenic and magnetic environments, often combined together. Careful evaluations of the dielectric resonator (DR) design are necessary to operate in these conditions. Moreover, the evaluation of the uncertainties and the issues related to an appropriate calibration become problematic. We present here a performance analysis of DRs designed for cryogenic temperature and high magnetic field operation and some sample experimental results on Z measurements on the most technologically interesting superconductors.

Alimenti, A., Torokhtii, K., Silva, E., Pompeo, N. (2019). Challenging microwave resonant measurement techniques for conducting material characterization. MEASUREMENT SCIENCE & TECHNOLOGY, 30(6), 065601 [10.1088/1361-6501/ab0e65].

Challenging microwave resonant measurement techniques for conducting material characterization

Alimenti A.
;
Torokhtii K.;Silva E.;Pompeo N.
2019

Abstract

Dielectric loaded resonators, by virtue of their high sensitivity, are a de facto standard for the measurement of the microwave surface impedance Z of good conductors, including superconductors. However, new perspective applications of superconductors request measurements in increasingly extreme conditions: cryogenic and magnetic environments, often combined together. Careful evaluations of the dielectric resonator (DR) design are necessary to operate in these conditions. Moreover, the evaluation of the uncertainties and the issues related to an appropriate calibration become problematic. We present here a performance analysis of DRs designed for cryogenic temperature and high magnetic field operation and some sample experimental results on Z measurements on the most technologically interesting superconductors.
Alimenti, A., Torokhtii, K., Silva, E., Pompeo, N. (2019). Challenging microwave resonant measurement techniques for conducting material characterization. MEASUREMENT SCIENCE & TECHNOLOGY, 30(6), 065601 [10.1088/1361-6501/ab0e65].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/355369
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