We demonstrate a novel interferometric characterization scheme that allows the complete reconstruction of two interfering electric fields. The phase profiles of both beams, and their relative phase, can be retrieved simultaneously as a function of any degree of freedom in which it is possible to shear one of the beams. The method has applications in wavefront sensing or ultrashort-pulse measurement, especially also in the domain of extreme light sources where it is difficult to generate a reference field or to replicate the beam in order to perform a self-referencing measurement. We demonstrate the technique experimentally by measuring simultaneously two ultrashort pulses in a single laser shot. © 2013 Optical Society of America.
Bourassin-Bouchet, C., Mang, M.M., Gianani, I., Walmsley, I.A. (2013). Mutual interferometric characterization of a pair of independent electric fields. OPTICS LETTERS, 38(24), 5299-5302 [10.1364/OL.38.005299].
Mutual interferometric characterization of a pair of independent electric fields
Gianani I.;
2013-01-01
Abstract
We demonstrate a novel interferometric characterization scheme that allows the complete reconstruction of two interfering electric fields. The phase profiles of both beams, and their relative phase, can be retrieved simultaneously as a function of any degree of freedom in which it is possible to shear one of the beams. The method has applications in wavefront sensing or ultrashort-pulse measurement, especially also in the domain of extreme light sources where it is difficult to generate a reference field or to replicate the beam in order to perform a self-referencing measurement. We demonstrate the technique experimentally by measuring simultaneously two ultrashort pulses in a single laser shot. © 2013 Optical Society of America.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
