EVANGELISTI, Florestano
EVANGELISTI, Florestano
2DEG based on strained Si on SGOI substrate
2008-01-01 L., DI GASPARE; A., Notargiacomo; E., Giovine; M., DE SETA; G., Capellini; M., Pea; G., Ciasca; Evangelisti, Florestano
A single electron transistor based on Si/SiGe wires
2003-01-01 A., Notargiacomo; L., DI GASPARE; G., Scappucci; G., Mariottini; E., Giovine; R., Leoni; Evangelisti, Florestano
A-SI-H BASED PARTICLE DETECTORS WITH LOW DEPLETION VOLTAGE
1993-01-01 Morosanu, C; Cesile, C; Korepanov, S; Fiorini, P; Bacci, C; Meddi, F; Evangelisti, Florestano; Mittiga, A.
A-SI-H P-I-N JUNCTIONS AS IONIZING PARTICLE DETECTORS
1989-01-01 Aglietti, U; Bacci, C; Evangelisti, Florestano; Falconieri, M; Fiorini, P; Meddi, F; Mittiga, A; Salvini, G.
A-SI1-XGEX-H ALLOYS FOR SOLAR-CELLS
1987-01-01 Mariucci, L; Ferrazza, F; Dellasala, D; Capizzi, M; Evangelisti, Florestano; Coscia, U.
Active electric near field imaging of electronic devices
2008-01-01 A., Coppa; V., Foglietti; E., Giovine; A., Doria; G. P., Gallerano; E., Giovenale; A., Cetronio; C., Lanzieri; M., Peroni; Evangelisti, Florestano
Agglomeration process in thin silicon-, strained silicon-, and silicon germanium-on insulator substrates
2009-01-01 G., Capellini; G., Ciasca; M., DE SETA; A., Notergiacomo; Evangelisti, Florestano
Alloying in Ge(Si)/Si(001) self-assembled islands during their growth and capping: XPS and AFM study
2008-01-01 M., DE SETA; G., Capellini; Evangelisti, Florestano
AMORPHOUS HYDROGENATED ALLOYS - A COMPARATIVE EXAFS STUDY OF A-SI1-XCX-H, A-SI1-XGEX-H, A-SINX-H AT THE SILICON K-EDGE
1986-01-01 Filipponi, A; Fiorini, P; Evangelisti, Florestano; Balerna, A; Mobilio, Settimio
AMORPHOUS SI/GE HETEROJUNCTIONS - BAND DISCONTINUITIES AND LOCAL ORDER STUDIED BY PHOTOEMISSION SPECTROSCOPY
1988-01-01 Cimino, R; Boscherini, F; Evangelisti, Florestano; Patella, F; Perfetti, P; Quaresima, C.
Anomalous Franz-Keldysh effect in the electroreflectance of semiconductors
1968-01-01 Evangelisti, Florestano; A., Frova
ATOMIC AND ELECTRONIC-STRUCTURE OF A-SI1-XCX-H ALLOYS
1993-01-01 Evangelisti, Florestano
Atomic force microscopy and photoluminescence study of Ge layers and self-organized Ge quantum dots on Si(100)
1996-01-01 Palange, E; Capellini, G; Digaspare, L; Evangelisti, Florestano
Atomic force microscopy litography as a nanodevice development
1999-01-01 A., Notargiacomo; V., Foglietti; E., Cianci; G., Capellini; M., Adami; P., Faraci; Evangelisti, Florestano
Atomic force microscopy study of self-organized Ge islands grown on Si(100) by low pressure chemical vapor deposition
1997-01-01 Capellini, G; Digaspare, L; Evangelisti, Florestano; Palange, E.
AUGEREMISSION-SPECTROSCOPY AND PHOTOEMISSION-SPECTROSCOPY STUDIES OF THE LOCAL DENSITY OF STATES OF A-SI1-XCX-H ALLOYS AT LOW C-CONCENTRATION
1993-01-01 Deseta, M; Wang, Sl; Fumi, F; Evangelisti, Florestano
Brillouin scattering efficiencies of exciton polaritons and the additional boundary conditions in CdS
1979-01-01 P. Y., Yu; Evangelisti, Florestano
Characterization and luminescence of a-Si:H:Cl films
1981-01-01 G., Fortunato; Evangelisti, Florestano; G., Bruno; P., Capezzuto; F., Cramarossa; V., Augelli; R., Murri
Conductance and valley splitting in etched Si/SiGe one-dimensional nanostructures
2010-01-01 G., Frucci; L., DI GASPARE; Evangelisti, Florestano; E., Giovine; A., Notargiacomo; V., Piazza; F., Beltram
Conductance quantization in etched Si/SiGe quantum point contacts
2006-01-01 G., Scappucci; L., DI GASPARE; E., Giovine; A., Notargiacomo; R., Leoni; Evangelisti, Florestano
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| 2DEG based on strained Si on SGOI substrate | 1-gen-2008 | L., DI GASPARE; A., Notargiacomo; E., Giovine; M., DE SETA; G., Capellini; M., Pea; G., Ciasca; Evangelisti, Florestano | |
| A single electron transistor based on Si/SiGe wires | 1-gen-2003 | A., Notargiacomo; L., DI GASPARE; G., Scappucci; G., Mariottini; E., Giovine; R., Leoni; Evangelisti, Florestano | |
| A-SI-H BASED PARTICLE DETECTORS WITH LOW DEPLETION VOLTAGE | 1-gen-1993 | Morosanu, C; Cesile, C; Korepanov, S; Fiorini, P; Bacci, C; Meddi, F; Evangelisti, Florestano; Mittiga, A. | |
| A-SI-H P-I-N JUNCTIONS AS IONIZING PARTICLE DETECTORS | 1-gen-1989 | Aglietti, U; Bacci, C; Evangelisti, Florestano; Falconieri, M; Fiorini, P; Meddi, F; Mittiga, A; Salvini, G. | |
| A-SI1-XGEX-H ALLOYS FOR SOLAR-CELLS | 1-gen-1987 | Mariucci, L; Ferrazza, F; Dellasala, D; Capizzi, M; Evangelisti, Florestano; Coscia, U. | |
| Active electric near field imaging of electronic devices | 1-gen-2008 | A., Coppa; V., Foglietti; E., Giovine; A., Doria; G. P., Gallerano; E., Giovenale; A., Cetronio; C., Lanzieri; M., Peroni; Evangelisti, Florestano | |
| Agglomeration process in thin silicon-, strained silicon-, and silicon germanium-on insulator substrates | 1-gen-2009 | G., Capellini; G., Ciasca; M., DE SETA; A., Notergiacomo; Evangelisti, Florestano | |
| Alloying in Ge(Si)/Si(001) self-assembled islands during their growth and capping: XPS and AFM study | 1-gen-2008 | M., DE SETA; G., Capellini; Evangelisti, Florestano | |
| AMORPHOUS HYDROGENATED ALLOYS - A COMPARATIVE EXAFS STUDY OF A-SI1-XCX-H, A-SI1-XGEX-H, A-SINX-H AT THE SILICON K-EDGE | 1-gen-1986 | Filipponi, A; Fiorini, P; Evangelisti, Florestano; Balerna, A; Mobilio, Settimio | |
| AMORPHOUS SI/GE HETEROJUNCTIONS - BAND DISCONTINUITIES AND LOCAL ORDER STUDIED BY PHOTOEMISSION SPECTROSCOPY | 1-gen-1988 | Cimino, R; Boscherini, F; Evangelisti, Florestano; Patella, F; Perfetti, P; Quaresima, C. | |
| Anomalous Franz-Keldysh effect in the electroreflectance of semiconductors | 1-gen-1968 | Evangelisti, Florestano; A., Frova | |
| ATOMIC AND ELECTRONIC-STRUCTURE OF A-SI1-XCX-H ALLOYS | 1-gen-1993 | Evangelisti, Florestano | |
| Atomic force microscopy and photoluminescence study of Ge layers and self-organized Ge quantum dots on Si(100) | 1-gen-1996 | Palange, E; Capellini, G; Digaspare, L; Evangelisti, Florestano | |
| Atomic force microscopy litography as a nanodevice development | 1-gen-1999 | A., Notargiacomo; V., Foglietti; E., Cianci; G., Capellini; M., Adami; P., Faraci; Evangelisti, Florestano | |
| Atomic force microscopy study of self-organized Ge islands grown on Si(100) by low pressure chemical vapor deposition | 1-gen-1997 | Capellini, G; Digaspare, L; Evangelisti, Florestano; Palange, E. | |
| AUGEREMISSION-SPECTROSCOPY AND PHOTOEMISSION-SPECTROSCOPY STUDIES OF THE LOCAL DENSITY OF STATES OF A-SI1-XCX-H ALLOYS AT LOW C-CONCENTRATION | 1-gen-1993 | Deseta, M; Wang, Sl; Fumi, F; Evangelisti, Florestano | |
| Brillouin scattering efficiencies of exciton polaritons and the additional boundary conditions in CdS | 1-gen-1979 | P. Y., Yu; Evangelisti, Florestano | |
| Characterization and luminescence of a-Si:H:Cl films | 1-gen-1981 | G., Fortunato; Evangelisti, Florestano; G., Bruno; P., Capezzuto; F., Cramarossa; V., Augelli; R., Murri | |
| Conductance and valley splitting in etched Si/SiGe one-dimensional nanostructures | 1-gen-2010 | G., Frucci; L., DI GASPARE; Evangelisti, Florestano; E., Giovine; A., Notargiacomo; V., Piazza; F., Beltram | |
| Conductance quantization in etched Si/SiGe quantum point contacts | 1-gen-2006 | G., Scappucci; L., DI GASPARE; E., Giovine; A., Notargiacomo; R., Leoni; Evangelisti, Florestano |