Benvenuti nell'Anagrafe della Ricerca d'Ateneo

EVANGELISTI, Florestano

EVANGELISTI, Florestano  

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Risultati 1 - 20 di 149 (tempo di esecuzione: 0.039 secondi).
Titolo Data di pubblicazione Autore(i) File
2DEG based on strained Si on SGOI substrate 1-gen-2008 L., DI GASPARE; A., Notargiacomo; E., Giovine; M., DE SETA; G., Capellini; M., Pea; G., Ciasca; Evangelisti, Florestano
A single electron transistor based on Si/SiGe wires 1-gen-2003 A., Notargiacomo; L., DI GASPARE; G., Scappucci; G., Mariottini; E., Giovine; R., Leoni; Evangelisti, Florestano
A-SI-H BASED PARTICLE DETECTORS WITH LOW DEPLETION VOLTAGE 1-gen-1993 Morosanu, C; Cesile, C; Korepanov, S; Fiorini, P; Bacci, C; Meddi, F; Evangelisti, Florestano; Mittiga, A.
A-SI-H P-I-N JUNCTIONS AS IONIZING PARTICLE DETECTORS 1-gen-1989 Aglietti, U; Bacci, C; Evangelisti, Florestano; Falconieri, M; Fiorini, P; Meddi, F; Mittiga, A; Salvini, G.
A-SI1-XGEX-H ALLOYS FOR SOLAR-CELLS 1-gen-1987 Mariucci, L; Ferrazza, F; Dellasala, D; Capizzi, M; Evangelisti, Florestano; Coscia, U.
Active electric near field imaging of electronic devices 1-gen-2008 A., Coppa; V., Foglietti; E., Giovine; A., Doria; G. P., Gallerano; E., Giovenale; A., Cetronio; C., Lanzieri; M., Peroni; Evangelisti, Florestano
Agglomeration process in thin silicon-, strained silicon-, and silicon germanium-on insulator substrates 1-gen-2009 G., Capellini; G., Ciasca; M., DE SETA; A., Notergiacomo; Evangelisti, Florestano
Alloying in Ge(Si)/Si(001) self-assembled islands during their growth and capping: XPS and AFM study 1-gen-2008 M., DE SETA; G., Capellini; Evangelisti, Florestano
AMORPHOUS HYDROGENATED ALLOYS - A COMPARATIVE EXAFS STUDY OF A-SI1-XCX-H, A-SI1-XGEX-H, A-SINX-H AT THE SILICON K-EDGE 1-gen-1986 Filipponi, A; Fiorini, P; Evangelisti, Florestano; Balerna, A; Mobilio, Settimio
AMORPHOUS SI/GE HETEROJUNCTIONS - BAND DISCONTINUITIES AND LOCAL ORDER STUDIED BY PHOTOEMISSION SPECTROSCOPY 1-gen-1988 Cimino, R; Boscherini, F; Evangelisti, Florestano; Patella, F; Perfetti, P; Quaresima, C.
Anomalous Franz-Keldysh effect in the electroreflectance of semiconductors 1-gen-1968 Evangelisti, Florestano; A., Frova
ATOMIC AND ELECTRONIC-STRUCTURE OF A-SI1-XCX-H ALLOYS 1-gen-1993 Evangelisti, Florestano
Atomic force microscopy and photoluminescence study of Ge layers and self-organized Ge quantum dots on Si(100) 1-gen-1996 Palange, E; Capellini, G; Digaspare, L; Evangelisti, Florestano
Atomic force microscopy litography as a nanodevice development 1-gen-1999 A., Notargiacomo; V., Foglietti; E., Cianci; G., Capellini; M., Adami; P., Faraci; Evangelisti, Florestano
Atomic force microscopy study of self-organized Ge islands grown on Si(100) by low pressure chemical vapor deposition 1-gen-1997 Capellini, G; Digaspare, L; Evangelisti, Florestano; Palange, E.
AUGEREMISSION-SPECTROSCOPY AND PHOTOEMISSION-SPECTROSCOPY STUDIES OF THE LOCAL DENSITY OF STATES OF A-SI1-XCX-H ALLOYS AT LOW C-CONCENTRATION 1-gen-1993 Deseta, M; Wang, Sl; Fumi, F; Evangelisti, Florestano
Brillouin scattering efficiencies of exciton polaritons and the additional boundary conditions in CdS 1-gen-1979 P. Y., Yu; Evangelisti, Florestano
Characterization and luminescence of a-Si:H:Cl films 1-gen-1981 G., Fortunato; Evangelisti, Florestano; G., Bruno; P., Capezzuto; F., Cramarossa; V., Augelli; R., Murri
Conductance and valley splitting in etched Si/SiGe one-dimensional nanostructures 1-gen-2010 G., Frucci; L., DI GASPARE; Evangelisti, Florestano; E., Giovine; A., Notargiacomo; V., Piazza; F., Beltram
Conductance quantization in etched Si/SiGe quantum point contacts 1-gen-2006 G., Scappucci; L., DI GASPARE; E., Giovine; A., Notargiacomo; R., Leoni; Evangelisti, Florestano