Bemporad, E., Sebastiani, M., F., C. (2006). HIGH RESOLUTION MORPHOLOGICAL AND MECHANICAL CHARACTERIZATION OF NIOBIUM FILMS OBTAINED BY MS AND BIASED MS PVD. In Thin films and new ideas for pushing the limits of RF Superconductivity.
HIGH RESOLUTION MORPHOLOGICAL AND MECHANICAL CHARACTERIZATION OF NIOBIUM FILMS OBTAINED BY MS AND BIASED MS PVD
BEMPORAD, Edoardo;SEBASTIANI, MARCO;
2006-01-01
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