On the bases of the RF characteristics and measured small-signal parameters, an equivalent circuit model is formulated and characterized for Metal-Semiconductor Field Effect Transistors based on H-terminated polycrystalline diamond. Starting from on-wafer measurements, a bias dependent transistor behavior representation has been fully determinated. Such a equivalent circuit model is a first important step in order to realize an RF IC based on diamond.
Pasciuto B., Ciccognani, W., Limiti, E., Calvani, et al. (2009). Modeling of Metal-Semiconductor Field-Effect-Transistor on H-terminated polycrystalline diamond. In ULIS 2009: 10TH INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION OF SILICON (pp.261-264).
Titolo: | Modeling of Metal-Semiconductor Field-Effect-Transistor on H-terminated polycrystalline diamond |
Autori: | |
Data di pubblicazione: | 2009 |
Citazione: | Pasciuto B., Ciccognani, W., Limiti, E., Calvani, et al. (2009). Modeling of Metal-Semiconductor Field-Effect-Transistor on H-terminated polycrystalline diamond. In ULIS 2009: 10TH INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION OF SILICON (pp.261-264). |
Abstract: | On the bases of the RF characteristics and measured small-signal parameters, an equivalent circuit model is formulated and characterized for Metal-Semiconductor Field Effect Transistors based on H-terminated polycrystalline diamond. Starting from on-wafer measurements, a bias dependent transistor behavior representation has been fully determinated. Such a equivalent circuit model is a first important step in order to realize an RF IC based on diamond. |
Handle: | http://hdl.handle.net/11590/174477 |
Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |