Bemporad, E., Sebastiani, M., Carassiti, F. (2006). HIGH RESOLUTION MORPHOLOGICAL AND MECHANICAL CHARACTERIZATION OF NIOBIUM FILMS OBTAINED BY MS AND BIASED MS PVD. In Thin films and new ideas for pushing the limits of RF Superconductivity. Padova. 9-12 Ottobre 2006.

HIGH RESOLUTION MORPHOLOGICAL AND MECHANICAL CHARACTERIZATION OF NIOBIUM FILMS OBTAINED BY MS AND BIASED MS PVD

BEMPORAD, Edoardo;SEBASTIANI, MARCO;
2006-01-01

Bemporad, E., Sebastiani, M., Carassiti, F. (2006). HIGH RESOLUTION MORPHOLOGICAL AND MECHANICAL CHARACTERIZATION OF NIOBIUM FILMS OBTAINED BY MS AND BIASED MS PVD. In Thin films and new ideas for pushing the limits of RF Superconductivity. Padova. 9-12 Ottobre 2006.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/176019
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