Bemporad, E., Sebastiani, M. (2010). Focused Ion Beam and Nano-Mechanical Tests for High-Resolution Surface Characterization: Not So Far Away from Jewelry Manufacturing. In Proceedings of the 24th Santa Fe Symposium on Jewelry manufacturing Technology in Albuquerque, New Mexico, 16-19 May 2010 (pp.51-78).
Focused Ion Beam and Nano-Mechanical Tests for High-Resolution Surface Characterization: Not So Far Away from Jewelry Manufacturing
BEMPORAD, Edoardo;SEBASTIANI, MARCO
2010-01-01
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