Sebastiani, M. (2010). Focused Ion Beam and Nano-Mechanical Tests for High-Resolution Surface Characterization: Not So Far Away from Jewelry Manufacturing. In Proceedings of the 24th Santa Fe Symposium in Albuquerque, New Mexico, 16-19 May 2010 (pp.51-78).

Focused Ion Beam and Nano-Mechanical Tests for High-Resolution Surface Characterization: Not So Far Away from Jewelry Manufacturing

SEBASTIANI, MARCO
2010-01-01

2010
978-0-931913-40-2
Sebastiani, M. (2010). Focused Ion Beam and Nano-Mechanical Tests for High-Resolution Surface Characterization: Not So Far Away from Jewelry Manufacturing. In Proceedings of the 24th Santa Fe Symposium in Albuquerque, New Mexico, 16-19 May 2010 (pp.51-78).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/178985
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